Optical constants

Refractive index of Si-Ge (Silicon-germanium, SiGe)

Jellison et al. 1993: 28% Si, Ge substrate; n,k 0.24–0.84 µm

Data
tabulated nk
Range
0.24–0.84 µm
Points
103
Licence
CC0-1.0

Plot

Click the plot to set the calculator wavelength.

At one wavelength

Range 0.24–0.84 µm
Refractive index n
4.91892
Extinction coefficient k
0.29488
Permittivity ε1
24.1088
Permittivity ε2
2.90098
Absorption coefficient α
63062.8 cm⁻¹
Penetration depth δ = λ/(2πk)
317.144 nm
Abbe number Vd
—
Chromatic dispersion dn/dλ
-5.8 µm⁻¹
Group index ng
8.327
Group velocity dispersion
— fs²/mm
Dispersion parameter D
— ps/(nm·km)
Photon energy
2.11001 eV

ε = (n + ik)², α = 4πk/λ, ng = n − λ dn/dλ, GVD = λ³/(2πc²) d²n/dλ², D = −(λ/c) d²n/dλ². Group-velocity dispersion is given for formula data only.

Use it in Lightsmith

Load this data in Python, simulate in one more line

pip install lightsmith
import lightsmith as ls

# Si-Ge (Silicon-germanium, SiGe): Jellison et al. 1993: 28% Si, Ge substrate; n,k 0.24–0.84 µm
si_ge = ls.fetch_refractiveindex("other", "Si-Ge", "Jellison-28", ref="c5c2f188e848453def5970e347399d653df2ffc2")
print(si_ge.range_nm)  # (240, 840) nm
eps = si_ge.eps([633])  # complex permittivity

Downloads the original record once (pinned to the imported snapshot) and caches it.

Lightsmith is open source (MIT): Mie, T-matrix, BEM, DDA, FDTD, RCWA, TMM, mode solvers and inverse design behind one spec, on CPU or GPU. GitHub.

Comments and conditions

SixGe1-x, x = 0.28. 8-μm film grown on Ge substrate.

Conditions

x
0.28
thickness
8 μm
substrate
Ge

References

G. E. Jellison Jr., T. E. Haynes, H. H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry. Opt. Mat. 2, 105-117 (1993)

Cite

G.E. Jellison, T.E. Haynes and H.H. Burke. Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry. Optical Materials, 2, 105-117 (1993), doi:10.1016/0925-3467(93)90035-y; Data from the refractiveindex.info database (M. N. Polyanskiy, Sci. Data 11, 94 (2024), doi:10.1038/s41597-023-02898-2)

Data

103 rows as published
Si-Ge (Silicon-germanium, SiGe), Jellison et al. 1993: 28% Si, Ge substrate; n,k 0.24–0.84 µm: n and k versus wavelength
λ (µm)nk
0.241.6553.144
0.2421.6343.176
0.2441.6363.221
0.2461.6613.27
0.2481.6743.333
0.251.6913.385
0.2521.7243.451
0.2541.7663.515
0.2561.7833.573
0.2581.8213.638
0.261.8663.715
0.2621.9063.792
0.2641.9533.864
0.2662.0083.945
0.2682.0814.031
0.272.1454.115
0.2722.2374.212
0.2742.3484.307
0.2762.4594.398
0.2782.6014.482
0.282.7734.571
0.2822.9754.631
0.2843.2014.65
0.2863.4254.623
0.2883.674.546
0.293.8464.432
0.2923.9964.298
0.2944.1034.155
0.2964.2014.009
0.2984.2453.887
0.34.2863.767
0.3044.3473.556
0.3084.3593.394
0.3124.3663.26
0.3164.3823.147
0.324.3863.056
0.3244.3982.973
0.3284.42.897
0.3324.4082.831
0.3364.4262.774
0.344.4322.725
0.3444.4452.679
0.3484.4572.637
0.3524.4782.593
0.3564.4982.554
0.364.5172.52
0.3644.5422.484
0.3684.572.441
0.3724.5962.398
0.3764.6222.347
0.384.6392.302
0.3844.6562.25
0.3884.6682.201
0.3924.6732.151
0.3964.6722.105
0.44.6652.069
0.4044.6582.041
0.4084.6512.022
0.4124.6522.006
0.4164.6551.996
0.424.6611.988
0.434.7011.983
0.444.7691.974
0.454.8671.949
0.464.991.906
0.475.1281.827
0.485.251.693
0.495.3341.545
0.55.4211.395
0.515.4971.181
0.525.4850.949
0.535.4180.759
0.545.3150.615
0.555.2130.511
0.565.1220.434
0.575.0390.378
0.584.9630.323
0.594.9050.286
0.64.8440.253
0.614.7890.226
0.624.7460.202
0.634.6940.18
0.644.6550.162
0.654.6170.142
0.664.5810.128
0.674.5490.114
0.684.5190.105
0.694.4920.092
0.74.4610.079
0.714.4370.069
0.724.4110.057
0.734.3810.056
0.744.3330.052
0.754.3150.053
0.764.3070.052
0.774.290.046
0.784.2680.042
0.794.2580.042
0.84.2480.042
0.814.240.037
0.824.2190.032
0.834.2160.03
0.844.1660.037

Optical transmission calculator

Free-standing sample in vacuum, normal incidence
Method
Transmittance T
—
Reflectance R
—

Fresnel reflection calculator

Direction
Rp
—
Rs
—
R = (Rp+Rs)/2
—
Phase φp
—
Phase φs
—
Brewster angle θB
—
Critical angle θC
—