Optical constants

Refractive index of MoS2 (Molybdenum disulfide)

Yim et al. 2014: 20-nm film; n,k 0.38–0.90 µm

Data
tabulated n + tabulated k
Range
0.3815–0.8847 µm
Points
15
State
crystalline
Licence
CC0-1.0

Plot

Click the plot to set the calculator wavelength. Note: k data cover 382.938-889.147 nm only; k = 0 elsewhere in the n range 381.514-884.671 nm.

At one wavelength

Range 0.3815–0.8847 µm
Refractive index n
4.06807
Extinction coefficient k
1.16015
Permittivity ε1
15.2033
Permittivity ε2
9.43911
Absorption coefficient α
248108 cm⁻¹
Penetration depth δ = λ/(2πk)
80.61 nm
Abbe number Vd
—
Chromatic dispersion dn/dλ
-2.44904 µm⁻¹
Group index ng
5.50712
Group velocity dispersion
— fs²/mm
Dispersion parameter D
— ps/(nm·km)
Photon energy
2.11001 eV

ε = (n + ik)², α = 4πk/λ, ng = n − λ dn/dλ, GVD = λ³/(2πc²) d²n/dλ², D = −(λ/c) d²n/dλ². Group-velocity dispersion is given for formula data only.

Use it in Lightsmith

Load this data in Python, simulate in one more line

pip install lightsmith
import lightsmith as ls

# MoS2 (Molybdenum disulfide): Yim et al. 2014: 20-nm film; n,k 0.38–0.90 µm
mos2 = ls.fetch_refractiveindex("main", "MoS2", "Yim-20nm", ref="c5c2f188e848453def5970e347399d653df2ffc2")
print(mos2.range_nm)  # (381.514, 884.671) nm
eps = mos2.eps([633])  # complex permittivity

Downloads the original record once (pinned to the imported snapshot) and caches it.

Lightsmith is open source (MIT): Mie, T-matrix, BEM, DDA, FDTD, RCWA, TMM, mode solvers and inverse design behind one spec, on CPU or GPU. GitHub.

Comments and conditions

19.88 nm film synthesized by vapor phase sulfurization. ~290 nm thick SiO2 substrate thermally grown on <100> oriented crystalline Si wafer.

Conditions

film thickness
19.88e-9
substrate
SiO2/Si
Notes on the source data (kept exactly as published):
  • k data cover 382.938-889.147 nm only; k = 0 elsewhere in the n range 381.514-884.671 nm

References

C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney, G. S. Duesberg. Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry. Appl. Phys. Let. 104, 103114 (2014)
  • doi:10.1063/1.4868108 Investigation of the optical properties of MoS <sub>2</sub> thin films using spectroscopic ellipsometry, Applied Physics Letters (2014)

Cite

Chanyoung Yim et al.. Investigation of the optical properties of MoS <sub>2</sub> thin films using spectroscopic ellipsometry. Applied Physics Letters, 104, 103114 (2014), doi:10.1063/1.4868108; Data from the refractiveindex.info database (M. N. Polyanskiy, Sci. Data 11, 94 (2024), doi:10.1038/s41597-023-02898-2)

Data

Computed on 15 wavelengths, the same grid as the API and the library
MoS2 (Molybdenum disulfide), Yim et al. 2014: 20-nm film; n,k 0.38–0.90 µm: n and k versus wavelength
λ (µm)nk
0.3815142.396710
0.4050583.05243.113168
0.4206363.407633.138354
0.4449584.126783.079873
0.4616364.645572.755816
0.4763794.91882.254705
0.493614.855721.773456
0.5180944.574621.297285
0.5658654.12131.115269
0.5989764.040211.217117
0.629654.195371.313532
0.6636144.468711.213666
0.6985084.505630.9574468
0.7339874.433430.7679715
0.8846714.171530.4350695

Optical transmission calculator

Free-standing sample in vacuum, normal incidence
Method
Transmittance T
—
Reflectance R
—

Fresnel reflection calculator

Direction
Rp
—
Rs
—
R = (Rp+Rs)/2
—
Phase φp
—
Phase φs
—
Brewster angle θB
—
Critical angle θC
—