Optical constants

Refractive index of Si (Silicon)

Šik et al. 1998: n,k 0.29–0.62 µm; 250 °C

Data
tabulated nk
Range
0.2883–0.6199 µm
Points
47
Temperature
523 K
State
crystalline
Licence
CC0-1.0

Plot

Click the plot to set the calculator wavelength.

At one wavelength

Range 0.2883–0.6199 µm
Refractive index n
4.08099
Extinction coefficient k
0.104899
Permittivity ε1
16.6435
Permittivity ε2
0.856179
Absorption coefficient α
22433.5 cm⁻¹
Penetration depth δ = λ/(2πk)
891.523 nm
Abbe number Vd
—
Chromatic dispersion dn/dλ
-2.78102 µm⁻¹
Group index ng
5.71512
Group velocity dispersion
— fs²/mm
Dispersion parameter D
— ps/(nm·km)
Photon energy
2.11001 eV

ε = (n + ik)², α = 4πk/λ, ng = n − λ dn/dλ, GVD = λ³/(2πc²) d²n/dλ², D = −(λ/c) d²n/dλ². Group-velocity dispersion is given for formula data only.

Use it in Lightsmith

Load this data in Python, simulate in one more line

pip install lightsmith
import lightsmith as ls

# Si (Silicon): Šik et al. 1998: n,k 0.29–0.62 µm; 250 °C
si = ls.fetch_refractiveindex("main", "Si", "Sik-250C", ref="c5c2f188e848453def5970e347399d653df2ffc2")
print(si.range_nm)  # (288.3, 619.9) nm
eps = si.eps([423])  # complex permittivity

Downloads the original record once (pinned to the imported snapshot) and caches it.

Lightsmith is open source (MIT): Mie, T-matrix, BEM, DDA, FDTD, RCWA, TMM, mode solvers and inverse design behind one spec, on CPU or GPU. GitHub.

Comments and conditions

Temperature: 250 °C (523 K).

Conditions

temperature
523 K

References

J. Šik, J. Hora, J. Humlı́ček. Optical functions of silicon at high temperatures. J. Appl. Phys. 84, 6291–6298 (1998)
  • doi:10.1063/1.368951 Optical functions of silicon at high temperatures, Journal of Applied Physics (1998)

Cite

J. Šik, J. Hora and J. Humlı́ček. Optical functions of silicon at high temperatures. Journal of Applied Physics, 84, 6291-6298 (1998), doi:10.1063/1.368951; Data from the refractiveindex.info database (M. N. Polyanskiy, Sci. Data 11, 94 (2024), doi:10.1038/s41597-023-02898-2)

Data

47 rows as published
Si (Silicon), Šik et al. 1998: n,k 0.29–0.62 µm; 250 °C: n and k versus wavelength
λ (µm)nk
0.28833.63575.1613
0.29173.93985.0904
0.29524.31194.9317
0.29884.61424.6638
0.30244.81064.3591
0.30614.91824.0889
0.314.97933.854
0.31395.01773.663
0.31795.03853.508
0.3225.0553.3798
0.32635.07943.2711
0.33065.11253.1746
0.33515.1483.0905
0.33975.1923.0162
0.34445.2482.9516
0.34935.31522.902
0.35425.40972.868
0.35945.56222.8298
0.36475.78632.7461
0.37016.0542.5653
0.37576.28982.2497
0.38156.41221.8239
0.38756.36261.3831
0.39366.18161.0256
0.39995.95520.7775
0.40655.73760.6083
0.41335.54280.4925
0.42035.37030.4125
0.42755.21870.3526
0.4355.08560.3048
0.44284.97020.2706
0.45094.86910.2413
0.45924.77770.2156
0.46794.69240.1971
0.47694.61570.1852
0.48624.54530.1716
0.49594.47950.1596
0.50614.41720.1483
0.51664.35770.1411
0.52764.3010.1372
0.53914.24810.1283
0.5514.19930.1191
0.56364.15370.1144
0.57674.11130.1119
0.59044.07320.1031
0.60484.03720.0929
0.61994.00130.1012

Optical transmission calculator

Free-standing sample in vacuum, normal incidence
Method
Transmittance T
—
Reflectance R
—

Fresnel reflection calculator

Direction
Rp
—
Rs
—
R = (Rp+Rs)/2
—
Phase φp
—
Phase φs
—
Brewster angle θB
—
Critical angle θC
—